Dr Aparna C Sheila Vadde, GE

Aparna Sheila-Vadde has been with the NDE Lab in GE Research since 2005. She has worked on design, simulation, testing and analysis of electromagnetic sensors for various inspection and monitoring applications. Prior to GE, Aparna worked at Western Digital Corp and Read-Rite, in Fremont, CA, for 3.5 years on GMR sensor design for hard-drives. Aparna has a B.Tech from Kerala University, MS from IISc and Ph.D from Carnegie Mellon University, all in ECE.