Present Affiliation: Scientific Officer/H
Head, X-ray Diffraction and Metrology Section
Accelerator Physics and Synchrotrons Utilization Division
Raja Ramanna Centre for Advanced Technology
E mail: sanjayrai@cat.ernet.in

Personal Details: Born on 29th June 1969

Educational Qualifications:

1990 M.Sc. (Physics) from Indian Institute of Technology Delhi, New Delhi, India.
2013 PhD from HBNI in Development of thin film based X-ray Optics

Experience
a. 34 years of experience in x-ray diffraction and its application in stress measurement, thin film characterization, x-ray reflectivity and powder diffraction.
b. Indigenous development of Hard-x-ray reflectometer/diffractometer on a x-ray tube source.
c. Development of thin film based x-ray mirrors and optics for synchrotron sources.
d. development of a new diffraction based beamline for doing stress measurement of actual components and for in-situ characterization of thin films
e. Worked on various projects of national importance such as Assessment of in-service in the landing gears of fighter aircrafts as part of their life extension programme undertaken by Indian Air Force (IAF). This project helped in optimum utilization of the landing gears and taking decision on extending their life with high reliability and without jeopardizing the safety of the aircraft.
f. He contributed or development first Indian x-ray telescope ASTROSAT developed jointly by TIFR and DRDO.

More than 200 Papers in International journals and conferences